FLAT CABLES FOR DIGITAL CIRCUITS.

被引:0
|
作者
Smith, Dennis
机构
来源
New Electronics | 1980年 / 13卷 / 02期
关键词
D O I
暂无
中图分类号
TM7 [输配电工程、电力网及电力系统];
学科分类号
080802 ;
摘要
Electrical tests are described on I/O flat cables, which were conducted to determine how the jacketed flat cable measures up against conventional twisted pair interconnections. The tests include characteristic impedance, propagation delay, capacitance, attenuation and crosstalk.
引用
下载
收藏
相关论文
共 50 条
  • [1] FATIGUE BEHAVIOR OF FLEX CABLES AND CIRCUITS.
    Engelmaier, Werner
    Electronic Packaging and Production, 1979, 19 (02): : 110 - 114
  • [2] DECOUPLING CAPACITORS IN DIGITAL CIRCUITS.
    Hawkes, Colin
    New Electronics, 1984, 17 (06):
  • [3] SIMULATION OF DIGITAL VLSI CIRCUITS.
    Dunn, A.
    1983, (03):
  • [4] Testability Analysis of Digital Circuits.
    Voigt, Sylvia
    Elektronik Munchen, 1982, 31 (19): : 71 - 75
  • [5] ELECTROMAGNETIC COMPATIBILITY IN DIGITAL CIRCUITS.
    Marshall, R.C.
    Engineering (London), 1981, 221 (11): : 850 - 852
  • [6] Digital Simulation of Nonlinear Electromagnetic Circuits.
    Jonas, Georg
    Elektrotechnische Zeitschrift Ausgabe B, 1975, 27 (22): : 598 - 601
  • [7] ANALOG BEHAVIOR OF DIGITAL INTEGRATED CIRCUITS.
    Glasser, Lance A.
    Proceedings - Design Automation Conference, 1981, : 603 - 612
  • [8] TEST GENERATION SYSTEM FOR DIGITAL CIRCUITS.
    Tomita, Kyouji
    Funatsu, Shigehiro
    Wakatsuki, Nobuo
    Yamada, Akihiko
    NEC Research and Development, 1978, (49): : 16 - 24
  • [9] ANALOG BEHAVIOR OF DIGITAL INTEGRATED CIRCUITS.
    Glasser, Lance A.
    Conference Record - Electro, 1981,
  • [10] COMPOUND SEMICONDUCTOR DIGITAL INTEGRATED CIRCUITS.
    Sleger, Kenneth
    Mack, Ingham
    Scott, Craig
    Buot, Felix
    Microwave journal, 1986, 29 (08): : 85 - 86