Investigation of the domain contrast in magnetic force microscopy

被引:0
|
作者
Belliard, L. [1 ]
Thiaville, A. [1 ]
Lemerle, S. [1 ]
Lagrange, A. [1 ]
Ferre, J. [1 ]
Miltat, J. [1 ]
机构
[1] Universite Paris Sud, Orsay, France
来源
Journal of Applied Physics | 1997年 / 81卷 / 8 pt 2A期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:3849 / 3851
相关论文
共 50 条
  • [41] Domain structure in polycrystalline MnZn ferrite imaged by magnetic force microscopy
    Aarts, J
    Abu Shiekah, I
    van der Zaag, PJ
    JOURNAL OF APPLIED PHYSICS, 1999, 85 (10) : 7302 - 7309
  • [42] Magnetic force microscopy of magnetic domain structure in highly ordered Co nanowire arrays
    Qin, DH
    Lu, M
    Li, HL
    CHEMICAL PHYSICS LETTERS, 2001, 350 (1-2) : 51 - 56
  • [43] Theoretical analysis of magnetic force microscopy contrast in multidomain states of magnetic superlattices with perpendicular anisotropy
    Donetsk Institute for Physics and Technology, 83114 Donetsk, Ukraine
    不详
    Journal of Applied Physics, 2008, 103 (04):
  • [44] Theoretical analysis of magnetic force microscopy contrast in multidomain states of magnetic superlattices with perpendicular anisotropy
    Kiselev, N. S.
    Dragunov, I. E.
    Neu, V.
    Roessler, U. K.
    Bogdanov, A. N.
    JOURNAL OF APPLIED PHYSICS, 2008, 103 (04)
  • [45] Magnetic force microscopy
    Hartmann, U
    ANNUAL REVIEW OF MATERIALS SCIENCE, 1999, 29 : 53 - 87
  • [46] MAGNETIC FORCE MICROSCOPY
    HARTMANN, U
    ADVANCED MATERIALS, 1990, 2 (11) : 550 - 552
  • [47] CONTRAST MECHANISMS OF FRICTION FORCE MICROSCOPY
    MEYER, E
    LUTHI, R
    HOWALD, L
    GUTMANNSBAUER, W
    GUNTHERODT, HJ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1995, 209 : 215 - COLL
  • [48] Kinetic contrast in atomic force Microscopy
    Sheglov, D. V.
    Latyshev, A. V.
    JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS, 2008, 106 (02) : 228 - 234
  • [49] Kinetic contrast in atomic force microscopy
    D. V. Sheglov
    A. V. Latyshev
    Journal of Experimental and Theoretical Physics, 2008, 106 : 228 - 234
  • [50] Advanced cantilevers for magnetic force microscopy and high frequency magnetic force microscopy
    Koblischka, M. R.
    Wei, J. D.
    Richter, C.
    Sulzbach, T. H.
    Hartmann, U.
    SCANNING, 2008, 30 (01) : 27 - 34