Linear type and a reflectron type time-of-flight mass spectrometers

被引:0
|
作者
Saito, N.
Koyama, K.
Tanimoto, M.
机构
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:23 / 30
相关论文
共 50 条
  • [31] An indigenous cluster beam apparatus with a reflectron time-of-flight mass spectrometer
    Raina, G
    Kulkarni, GU
    Yadav, RT
    Ramamurthy, VS
    Rao, CN
    PROCEEDINGS OF THE INDIAN ACADEMY OF SCIENCES-CHEMICAL SCIENCES, 2000, 112 (02): : 83 - 95
  • [32] A quadrupole ion trap time-of-flight mass spectrometer with a parabolic reflectron
    Doroshenko, VM
    Cotter, RJ
    JOURNAL OF MASS SPECTROMETRY, 1998, 33 (04): : 305 - 318
  • [33] The laser reflectron time-of-flight mass spectrometer used on cluster research
    Xing, XP
    Tian, ZX
    Liu, P
    Gao, Z
    Zhu, Q
    Tang, ZC
    CHINESE JOURNAL OF CHEMICAL PHYSICS, 2002, 15 (02): : 83 - 87
  • [34] MULTIPHOTON IONIZATION AND DISSOCIATION OF MIXED VANDERWAALS CLUSTERS IN A LINEAR REFLECTRON TIME-OF-FLIGHT MASS-SPECTROMETER
    ERNSTBERGER, B
    KRAUSE, H
    KIERMEIER, A
    NEUSSER, HJ
    JOURNAL OF CHEMICAL PHYSICS, 1990, 92 (09): : 5285 - 5296
  • [35] NEUTRON TIME-OF-FLIGHT SPECTROMETERS
    FIRK, FWK
    NUCLEAR INSTRUMENTS & METHODS, 1979, 162 (1-3): : 539 - 563
  • [36] Improvement of reflectron time-of-flight mass spectrometer for better convergence of ion beam
    Handa, Takefumi
    Horio, Takuya
    Arakawa, Masashi
    Terasaki, Akira
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 2020, 451
  • [37] Ion-optical properties of time-of-flight mass spectrometers
    Ioanoviciu, D
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 2001, 206 (03) : 211 - 229
  • [38] TIME-OF-FLIGHT MASS SPECTROMETERS WITH MULTIPLY REFLECTED ION TRAJECTORIES
    WOLLNIK, H
    PRZEWLOKA, M
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1990, 96 (03): : 267 - 274
  • [39] OSCILLOSCOPE DISPLAY AND ANALOG GATING FOR TIME-OF-FLIGHT MASS SPECTROMETERS
    RIGBY, LJ
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (12): : 1182 - 1183
  • [40] Direct sampling time-of-flight mass spectrometers for technological analysis
    Alexander A. Sysoev
    Alexey A. Sysoev
    S. S. Poteshin
    V. I. Pyatakhin
    I. V. Shchekina
    A. S. Trofimov
    Fresenius' Journal of Analytical Chemistry, 1998, 361 : 261 - 266