Characterization of 3C-SiC epitaxial layers on TiC(111) by Raman scattering

被引：0
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作者：
Harima, Hiroshi [1 ]
Nakashima, Shin-ichi [1 ]
Carulli, John M. [1 ]
Beetz Jr., Charles P. [1 ]
Yoo, Woo S. [1 ]
机构：
[1] Osaka Univ, Osaka, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1997年 / 36卷 / 9 A期
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页码：5525 / 5531
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