共 50 条
- [42] Intelligent process control of indium tin oxide sputter deposition using optical emission spectroscopy JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1999, 17 (01): : 190 - 197
- [43] Real-time process monitoring by optical emission spectroscopy in DRAM Gate CD control ISSM 2005: IEEE International Symposium on Semiconductor Manufacturing, Conference Proceedings, 2005, : 136 - 138
- [44] Optical emission spectroscopy diagnostic and thermodynamic analysis of thermal plasma enhanced nanocrystalline silicon CVD process RSC ADVANCES, 2014, 4 (29): : 15131 - 15137
- [47] Note: Plasma optical emission spectroscopy for water vapor quantification and detection during vacuum drying process REVIEW OF SCIENTIFIC INSTRUMENTS, 2018, 89 (11):
- [49] Comparison study between optical emission spectroscopy and x-ray photoelectron spectroscopy techniques during process etch plasma 2014 25TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC), 2014, : 417 - 422
- [50] End point control via optical emission spectroscopy JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (01): : 516 - 520