Effect of index of refraction on radiation characteristics in a heated absorbing, emitting, and scattering layer

被引：0
|
作者：
Siegel, R. [1 ]
C.M., Spuckler [1 ]
机构：
[1] NASA Lewis Research Cent, Cleveland, United States
来源：
Journal of Heat Transfer | 1992年 / 114卷 / 03期
关键词：
Temperature distribution;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
This paper shows that, for radiative equilibrium in a gray layer with diffuse interfaces, the temperature distribution and radiative heat flux for any index of refraction can be obtained very simply from the results for an index of refraction of unity. For the situation studied in this paper, the layer is subjected to external radiative heating incident on each of its surfaces. The material emits, absorbs, and isotropically scatters radiation. For simplicity the index of refraction is unity in the medium surrounding the layer.
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页码：781 / 784
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