DESIGN PUT TO THE TEST.

被引：0

作者：

Kunin, David ^{[1
]}

Desai, Nick ^{[1
]}

机构：

[1] Curtis Electronics, Santa Ana, CA,, USA, Curtis Electronics, Santa Ana, CA, USA

来源：

| 1600年 / 27期

关键词：

DESIGN FOR TESTABILITY - PRINTED CIRCUIT BOARD (PCB) - SURFACE MOUNT TECHNOLOGY (SMT);

D O I：

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摘要：

引用

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