Interference microscopy of sub-λ structures: a rigorous computation method and measurements

被引:0
|
作者
Universitaet Stuttgart, Stuttgart, Germany [1 ]
机构
来源
Opt Commun | / 1-2卷 / 61-74期
关键词
Number:; -; Acronym:; Sponsor: Deutsche Forschungsgemeinschaft;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [41] Nonresonant Laser-SNMS and TOF-SIMS analysis of sub-μm structures
    Kollmer, F
    Bourdos, N
    Kamischke, R
    Benninghoven, A
    APPLIED SURFACE SCIENCE, 2003, 203 : 238 - 243
  • [42] One (sub-)acinus for all: Fate of inhaled aerosols in heterogeneous pulmonary acinar structures
    Hofemeier, Philipp
    Koshiyama, Kenishiro
    Wada, Shigeo
    Sznitman, Josue
    EUROPEAN JOURNAL OF PHARMACEUTICAL SCIENCES, 2018, 113 : 53 - 63
  • [43] Correlative Microscopy for Nanomanipulation of Sub-Cellular Structures
    Gong, Z.
    Chen, B. K.
    Liu, J.
    Zhou, C.
    Anchel, D.
    Li, X.
    Bazett-Jones, D. P.
    Sun, Y.
    2014 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION (ICRA), 2014, : 5209 - 5214
  • [44] System for acoustic microscopy measurements of curved structures
    Wuest, Michael
    Eisenhart, Johannes
    Rief, Annika
    Rupitsch, Stefan J.
    TM-TECHNISCHES MESSEN, 2017, 84 (04) : 251 - 262
  • [45] Rigorous computation of a compact square patch antenna with notches using the moment method
    Boufrioua, Amel
    JOURNAL OF COMPUTATIONAL ELECTRONICS, 2019, 18 (01) : 197 - 204
  • [46] Rigorous computation of a compact square patch antenna with notches using the moment method
    Amel Boufrioua
    Journal of Computational Electronics, 2019, 18 : 197 - 204
  • [47] Stabilizing method for reflection interference contrast microscopy
    Kim, Kipom
    Saleh, Omar A.
    APPLIED OPTICS, 2008, 47 (12) : 2070 - 2075
  • [48] Research on signal processing method and calibration method of sub-μN micro-force sensor
    State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China
    不详
    Yi Qi Yi Biao Xue Bao, 2008, SUPPL. 2 (345-349):
  • [49] On necessary conditions for the comparison principle and the sub- and supersolution method for the stationary Kirchhoff equation
    Iturriaga, Leonelo
    Massa, Eugenio
    JOURNAL OF MATHEMATICAL PHYSICS, 2018, 59 (01)
  • [50] Interference microscope for sub-Angstrom surface roughness measurements
    Saxer, C
    Freischlad, K
    OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION III, 2003, 5144 : 37 - 45