Defect creation by low-energy ion bombardment on GaAs (001) and Ge (001) surfaces

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Kuronen, A. [1 ]
Tarus, J. [2 ]
Nordlund, K. [2 ]
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[1] Helsinki University of Technology, Lab. of Compl. Eng., P.O. Box 9400, Fin-02015 HUT, Finland
[2] University of Helsinki, Accel. Lab., P.O. Box 47, Univ. H., Fin-00014, Finland
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页码:209 / 212
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