共 50 条
- [1] Ultrathin resist pattern transfer process by filling mask material in the resist pattern JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2003, 42 (6B): : 3928 - 3932
- [2] LWR reduction in ArF resist pattern by resist smoothing process ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XXIII, PTS 1 AND 2, 2006, 6153 : U1481 - U1489
- [4] An in situ analysis of the resist pattern formation process ADVANCES IN RESIST MATERIALS AND PROCESSING TECHNOLOGY XXIX, 2012, 8325
- [5] Fine pattern process with negative tone resist PHOTOMASK AND X-RAY MASK TECHNOLOGY V, 1998, 3412 : 214 - 219
- [8] Advances in resist pattern transfer process using 157-nm lithography ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XXI, PTS 1 AND 2, 2004, 5376 : 1064 - 1073
- [9] Resist pattern collapse with top rounding resist profile JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2003, 42 (6B): : 3922 - 3927
- [10] Resist pattern collapse with top hounding resist profile Lee, H.-J. (lhjyhs@ihanyang.ac.kr), 1600, Japan Society of Applied Physics (42):