Research on a dual-stylus measurement system for surface topography characterization

被引：0
|
作者：
Lu, Sheng-Feng
Xie, Tie-Bang
Gao, Yong-Sheng
Li, Zhu
机构：
来源：
Jiliang Xuebao/Acta Metrologica Sinica | 2002年 / 23卷 / 03期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] Precision Cylindricity Error Measurement System Design and Surface Topography Reconstruction
    Liu, Chunyang
    Xue, Yujun
    Ma, Xiqang
    Sui, Xin
    Si, Donghong
    Li, Jishun
    2017 SECOND INTERNATIONAL CONFERENCE ON MECHANICAL, CONTROL AND COMPUTER ENGINEERING (ICMCCE), 2017, : 83 - 86
  • [32] A Measurement System for Surface Topography Based on Three-Wavelength Interferometry
    Yang Liangen
    Liu Chuang
    Wang Xuanze
    He Tao
    Zhai Zhongsheng
    2017 INTERNATIONAL CONFERENCE ON MECHANICAL, SYSTEM AND CONTROL ENGINEERING (ICMSC), 2017, : 272 - 277
  • [33] IMPORTANCE OF CHECKING THE STYLUS RADIUS IN THE MEASUREMENT OF SURFACE-ROUGHNESS
    ELEWA, I
    KOURA, MM
    WEAR, 1986, 109 (1-4) : 401 - 410
  • [34] Comparison of surface texture measurement by stylus and fiber optic transducers
    Scott, W
    Donovan, A
    JOURNAL OF TESTING AND EVALUATION, 1998, 26 (01) : 70 - 78
  • [35] Compact AFM system for rapid and large area surface topography measurement
    Ju, Bing-Feng
    Gao, Wei
    Aoki, Jim
    Asai, Takemi
    Kiyono, Satoshi
    Journal of the Chinese Society of Mechanical Engineers, Transactions of the Chinese Institute of Engineers, Series C/Chung-Kuo Chi Hsueh Kung Ch'eng Hsuebo Pao, 2006, 27 (05): : 525 - 530
  • [36] Simultaneous dual-wavelength phase-shifting interferometry for surface topography measurement
    Liu, Qian
    Li, Lulu
    Zhang, Hui
    Huang, Wen
    Yue, Xiaobin
    OPTICS AND LASERS IN ENGINEERING, 2020, 124
  • [37] NANO-CALIBRATION FOR STYLUS-BASED SURFACE MEASUREMENT
    WHITEHOUSE, DJ
    BOWEN, DK
    CHETWYND, DG
    DAVIES, ST
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1988, 21 (01): : 46 - 51
  • [38] Dynamic modelling of the fidelity of random surface measurement by the stylus method
    Tian, Y.
    Liu, X.
    Zhang, D.
    Chetwynd, D. G.
    WEAR, 2009, 266 (5-6) : 555 - 559
  • [39] Applied research on four-quadrant optoelectronic detector for surface topography measurement
    Wang Shuzhen
    Chang Suping
    Xie Tiebang
    Wang Xuanze
    3RD INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT, PARTS 1-3, 2007, 6723
  • [40] Characterization of measurement and instrument noise in areal surface topography measurements by the Allan deviation
    Vanrusselt, Maxim
    Haitjema, Han
    CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2023, 72 (01) : 485 - 488
12345