Quantitative analysis of variable-angle total internal reflection fluorescence microscopy (VA-TIRFM) of cell/substrate contacts

被引：0
|
作者：
Burmeister, J.S. [1 ]
Truskey, G.A. [1 ]
Reichert, W.M. [1 ]
机构：
[1] Department of Biomedical Engineering, Duke University, Durham, NC 27708, United States
来源：
Journal of Microscopy | 1994年 / 173卷 / 01期
关键词：
Fluorescence;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
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页码：39 / 51
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