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- [1] MINORITY-CARRIER DIFFUSION-COEFFICIENTS AND MOBILITIES IN SILICONIEEE ELECTRON DEVICE LETTERS, 1985, 6 (08) : 425 - 427NEUGROSCHEL, A
- [2] MINORITY-CARRIER DIFFUSION-COEFFICIENTS IN HIGHLY DOPED SILICONAPPLIED PHYSICS LETTERS, 1979, 35 (02) : 170 - 172DZIEWIOR, JSILBER, D
- [3] CALCULATED MAJORITY-CARRIER AND MINORITY-CARRIER MOBILITIES IN HEAVILY DOPED SILICON AND COMPARISONS WITH EXPERIMENTJOURNAL OF APPLIED PHYSICS, 1992, 71 (05) : 2285 - 2296BENNETT, HSLOWNEY, JR
- [4] MINORITY-CARRIER DIFFUSION LENGTH AND DOPING DENSITY IN NONDEGENERATE SILICONJOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (03) : C104 - C105HUBER, DBACHMEIER, AWAHLICH, RHERZER, H
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- [6] MEASUREMENT OF MINORITY-CARRIER TRANSPORT PARAMETERS IN HEAVILY DOPED n-TYPE SILICON.1600, (ED-32):del Alamo, J.Swanson, R.M.
- [7] MINORITY-CARRIER DIFFUSION LENGTHS IN AMORPHOUS SILICON-BASED ALLOYSJOURNAL OF APPLIED PHYSICS, 1982, 53 (09) : 6270 - 6275HACK, MMCGILL, JCZUBATYJ, WSINGH, RSHUR, MMADAN, A
- [8] MINORITY-CARRIER LIFETIME OF GAAS ON SILICONJOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1990, 137 (03) : 996 - 1000AHRENKIEL, RKALJASSIM, MMKEYES, BDUNLAVY, DJONES, KMVERNON, SMDIXON, TM
- [9] DETERMINATION OF THE MINORITY-CARRIER DIFFUSION LENGTH IN SILICON SOLAR-CELLSINTERNATIONAL JOURNAL OF ELECTRONICS, 1979, 46 (05) : 529 - 533VASEASHTA, AKARORA, JDMATHUR, PC
- [10] MINORITY-CARRIER LIFETIME IN SILICON PROCESSINGJOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (08) : C331 - C331PAK, MS