Semiconductor focus: Read-only & flash memories

被引:0
|
作者
机构
来源
EE Product News | 1998年 / 57卷 / 03期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] REALIZATION OF PROGRAMMABLE SEQUENCE CONTROLLERS USING SEMICONDUCTOR READ-ONLY MEMORIES
    RAHMAN, ML
    WOODWARD, ME
    IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS AND CONTROL INSTRUMENTATION, 1976, 23 (01): : 8 - 12
  • [2] LASER CODING OF BIPOLAR READ-ONLY MEMORIES
    NORTH, JC
    WEICK, WW
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1976, 11 (04) : 500 - 505
  • [3] SEQUENTIAL GENERATORS USING READ-ONLY MEMORIES
    LAPRIE, JC
    SOUNY, M
    ELECTRONICS LETTERS, 1973, 9 (06) : 142 - 143
  • [4] Fault Diagnosis for Embedded Read-Only Memories
    Mukherjee, N.
    Pogiel, A.
    Rajski, J.
    Tyszer, J.
    ITC: 2009 INTERNATIONAL TEST CONFERENCE, 2009, : 167 - +
  • [5] A LOGICAL NEXT STEP FOR READ-ONLY MEMORIES
    NICHOLS, JL
    ELECTRONICS, 1967, 40 (12): : 111 - &
  • [6] Radiation effects in nitride read-only memories
    Libertino, S.
    Corso, D.
    Mure, G.
    Marino, A.
    Palumbo, F.
    Principato, F.
    Cannella, G.
    Schillaci, T.
    Giarusso, S.
    Celi, F.
    Lisiansky, M.
    Roizin, Y.
    Lombardo, S.
    MICROELECTRONICS RELIABILITY, 2010, 50 (9-11) : 1857 - 1860
  • [7] SEMICONDUCTOR READ-ONLY MEMORY APPLICATIONS.
    Ammann, Robert W.
    Donnelly, J.Michael
    GTE Automatic Electric Technical Journal, 1975, 14 (08): : 370 - 381
  • [8] DIGITAL-FILTERS USING READ-ONLY MEMORIES
    NUSSBAUMER, H
    ELECTRONICS LETTERS, 1976, 12 (11) : 294 - 295
  • [9] MEASURING ACCESS TIME OF BIPOLAR READ-ONLY MEMORIES
    MCDOWELL, JJ
    ELECTRONICS, 1974, 47 (09): : 115 - 116
  • [10] LASER APPARATUS FOR RECORDING THE TRANSPARENCIES OF READ-ONLY MEMORIES
    VALIS, AS
    KAUSHINIS, SK
    MALISHAUSKAS, MA
    MALDZHYUNAS, AAY
    RAGULSKIS, KM
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1979, 46 (03): : 180 - 181