Refractive index measurement of the glass substrate of holographic plates using reflectivity data

被引：0
|
作者：
Departamento de Fisca, Ing. de Sist. y Teoria de la Senal, Universidad de Alicante, Apartado 99, E-03080 Alicante, Spain [1 ]
不详 [2 ]
机构：
来源：
Optik (Jena) | / 6卷 / 295-297期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
5
引用
收藏
相关论文
共 50 条
  • [21] The measurement of the refractive index n and extinction coefficient k values of the EUV resist using EUV reflectivity measurement method
    Sekiguchi, A.
    Ohta, Y.
    Harada, T.
    Watanabe, T.
    INTERNATIONAL CONFERENCE ON EXTREME ULTRAVIOLET LITHOGRAPHY 2022, 2022, 12292
  • [22] Study on refractive index measurement of high refractive index glass beads by secondary rainbow method
    Liu, Jing
    Li, Da-Hai
    Guangzi Xuebao/Acta Photonica Sinica, 2007, 36 (12): : 2307 - 2310
  • [23] Simulated study on the measurement of refractive index variation of a transparent object using holographic CT method
    Li, JC
    Xiong, BH
    Zhong, LY
    Lu, XX
    Zhang, YG
    PRACTICAL HOLOGRAPHY XVII AND HOLOGRAPHIC MATERIALS IX, 2003, 5005 : 316 - 324
  • [24] Refractive index measurement of suspended cells using opposed-view digital holographic microscopy
    Zheng, Juanjuan
    Gao, Peng
    Shao, Xiaopeng
    Nienhaus, G. Ulrich
    APPLIED OPTICS, 2017, 56 (32) : 9000 - 9005
  • [25] Full-field measurement of surface reflectivity using a microscopy for refractive index profiling of GRIN lenses
    Chun-Jen Weng
    Chih-Yen Chen
    Chi-Hung Hwang
    Da-Ren Liu
    Optical Review, 2016, 23 : 829 - 833
  • [26] Full-field measurement of surface reflectivity using a microscopy for refractive index profiling of GRIN lenses
    Weng, Chun-Jen
    Chen, Chih-Yen
    Hwang, Chi-Hung
    Liu, Da-Ren
    OPTICAL REVIEW, 2016, 23 (05) : 829 - 833
  • [27] HOLOGRAPHIC MEASUREMENT OF REFRACTIVE-INDEX PROFILE OF OPTICAL FIBER PREFORM
    CHU, PL
    PERI, D
    ELECTRONICS LETTERS, 1980, 16 (23) : 876 - 877
  • [28] Three-dimensional refractive index measurement by digital holographic microscopy
    Ma, Lihong
    Wang, Hui
    Li, Yong
    Su, Linglong
    INTERNATIONAL CONFERENCE ON OPTICS IN PRECISION ENGINEERING AND NANOTECHNOLOGY (ICOPEN2013), 2013, 8769
  • [29] The Measurement of the Refractive Index n and k Value of the EUV Resist by EUV Reflectivity Measurement Method
    Ohta, Yosuke
    Sekiguchi, Atsushi
    Harada, Tetsuo
    Watanabe, Takeo
    JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY, 2021, 34 (01) : 105 - 110
  • [30] Measuring refractive index of glass by using speckle
    Guo, Changliang
    Li, Dayan
    Kelly, Damien P.
    Li, Haoyu
    Ryle, James P.
    Sheridan, John T.
    APPLIED OPTICS, 2018, 57 (22) : E205 - E217
12345