Mechanism and conduction process of ferroelectric thin-film

被引：0
|
作者：
Jinan Univ, Jinan, China [1 ]
机构：
来源：
Gongneng Cailiao | / 4卷 / 293-301期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
28
引用
收藏
相关论文
共 50 条
  • [31] Inhomogeneous states of a thin-film incommensurate ferroelectric
    S. A. Ktitorov
    O. S. Pogorelova
    E. V. Charnaya
    Physics of the Solid State, 2003, 45 : 2166 - 2170
  • [32] Inhomogeneous states of a thin-film incommensurate ferroelectric
    Ktitorov, SA
    Pogorelova, OS
    Charnaya, EV
    PHYSICS OF THE SOLID STATE, 2003, 45 (11) : 2166 - 2170
  • [33] ELECTRICAL-CONDUCTION IN THIN-FILM DIAMOND
    SRIKANTH, K
    ASHOK, S
    BADZIAN, A
    BADZIAN, T
    MESSIER, R
    THIN SOLID FILMS, 1988, 164 : 187 - 190
  • [34] Electrical Conduction in Thin-Film Polypropylene Capacitors
    Michelazzi, Marco
    Fabiani, Davide
    ENERGIES, 2023, 16 (18)
  • [35] Heat conduction in ultrafast thin-film nanocalorimetry
    Minakov, Alexander A.
    Schick, Christoph
    THERMOCHIMICA ACTA, 2016, 640 : 42 - 51
  • [36] Ferroelectric-Gate Thin-Film Transistor Fabricated by Total Solution Deposition Process
    Miyasako, Takaaki
    Bui Nguyen Quoc Trinh
    Onoue, Masatoshi
    Kaneda, Toshihiko
    Phan Trong Tue
    Tokumitsu, Eisuke
    Shimoda, Tatsuya
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2011, 50 (04)
  • [37] Electron trapping process in ferroelectric lead-zirconate-titanate thin-film capacitors
    Chen, HM
    Lee, JYM
    APPLIED PHYSICS LETTERS, 1998, 73 (03) : 309 - 311
  • [38] Photogeneration process and charge conduction mechanism in poly(phenylazomethinethiophene) thin film devices
    Roy, MS
    Gupta, SK
    Sharma, GD
    PHYSICS OF SEMICONDUCTOR DEVICES, VOLS 1 AND 2, 1998, 3316 : 1243 - 1246
  • [39] Performance of Thin-Film Ferroelectric Capacitors for EMC Decoupling
    Li, Huadong
    Subramanyam, Guru
    IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 2008, 55 (12) : 2552 - 2558
  • [40] Electron emission from thin-film ferroelectric cathodes
    Liu, F
    Fleddermann, CB
    APPLIED PHYSICS LETTERS, 2000, 76 (12) : 1618 - 1620
12345