Stacked package delamination

被引:0
|
作者
Lin, T.Y.
机构
来源
Advanced Packaging | 2003年 / 12卷 / 02期
关键词
Computer simulation - Consumer electronics - Delamination - Dies - Finite element method - Fracture mechanics - Integrated circuits - Process engineering - Stiffness - Stress concentration - Thermal conductivity - Thermal stress;
D O I
暂无
中图分类号
学科分类号
摘要
A study was performed on stacked package delamination. The fish bone diagram that helps to identify the possible root causes inducing the delamination was discussed. The material, process and design aspects were evaluated by experiments and finite element analysis.
引用
收藏
页码:21 / 22
相关论文
共 50 条
  • [21] Structure optimization in the stacked package of IC microstructures
    Li, Hongpeng
    He, Yuting
    Zhang, Hengxi
    Cui, Ronghong
    PHYSICAL AND NUMERICAL SIMULATION OF MATERIALS PROCESSING, PTS 1 AND 2, 2008, 575-578 : 915 - 918
  • [22] EVALUATION OF A STACKED PACKAGE UTILIZING LGA DEVICES
    Srinivasan, G.
    Iyer, S.
    Havens, R.
    Srihari, K.
    PROCEEDINGS OF THE ASME INTERNATIONAL MECHANICAL ENGINEERING CONGRESS AND EXPOSITION 2010, VOL 4, 2012, : 315 - +
  • [23] A Novel Type of Stacked Cylindrical PoP Package
    Cheng, Li-ye
    Shi, Ling-feng
    Cai, Cheng-shan
    Meng, Chen
    Lai, Xin-quan
    2012 13TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2012), 2012, : 1124 - 1127
  • [24] Transient thermal characterization of a stacked multichip package
    Kaija, Kimmo
    Heino, Pekka
    Journal of Microelectronics and Electronic Packaging, 2007, 4 (01): : 23 - 30
  • [25] Investigation of the moisture impact on the stacked die package
    Lil, C. Y.
    Hua, Z. K.
    Luo, Y. X.
    Cao, L. Q.
    Zhang, J. H.
    ESTC 2008: 2ND ELECTRONICS SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 2008, : 1175 - +
  • [26] Moisture Induced Interface Delamination for EMI Shielding Package
    Liu, Yangming
    Ji, Zhongli
    Chen, Peng
    Wang, Xu
    Yee, Ning
    Chiu, Chin-Tien
    2016 IEEE CPMT SYMPOSIUM JAPAN (ICSJ), 2016, : 217 - 220
  • [27] Die attach delamination characterization modeling for SOIC package
    Liu, Y
    Irving, S
    Rioux, M
    Schoenberg, AJ
    Chong, D
    52ND ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2002 PROCEEDINGS, 2002, : 839 - 846
  • [28] The Effect of Etching Lead Frame on QFN Package Delamination
    Li, Yun
    Li, Tina
    2023 24TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT, 2023,
  • [29] Delamination growth in ball grid array electronic package
    Yeh, MK
    Lee, IS
    FRACTURE AND STRENGTH OF SOLIDS VI, PTS 1 AND 2, 2006, 306-308 : 363 - 368
  • [30] Package Autoclave Delamination Study by Substrate Design Improvement
    Liu, Jinmei
    Luo, Junhua
    Yao, Jinzhong
    PROCEEDINGS OF THE 2010 34TH IEEE/CPMT INTERNATIONAL ELECTRONICS MANUFACTURING TECHNOLOGY CONFERENCE (IEMT 2010), 2011,