Yield prediction and simulation technologies of VLSI

被引：0
|
作者：
Hao, Yue [1 ]
Ma, Peijun [1 ]
Lin, Rui [1 ]
机构：
[1] Xidian Univ, Xi'an, China
来源：
Tien Tzu Hsueh Pao/Acta Electronica Sinica | 1999年 / 27卷 / 02期
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摘要：
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页码：55 / 58
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