Fault tolerance via component redundancy for a modularized sensitive skin

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作者：
Um, D. [1 ]
Lumelsky, V. [1 ]
机构：
[1] Univ of Wisconsin-Madison, Madison, United States
来源：
Proceedings - IEEE International Conference on Robotics and Automation | 1999年 / 1卷
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页码：722 / 727
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