Effect of Capillary Force on Friction Force Microscopy: A Scanning Hydrophilicity Microscope

被引：0
|
作者：
机构：
来源：
Chem Lett | / 7卷 / 499期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] Inverse problem of scanning force microscope force measurements
    Todd, BA
    Eppell, SJ
    JOURNAL OF APPLIED PHYSICS, 2003, 94 (05) : 3563 - 3572
  • [32] Inverse problem of scanning force microscope force measurements
    Eppell, S.J. (sje@cwru.edu), 1600, American Institute of Physics Inc. (94):
  • [33] PIEZOELECTRIC FORCE SENSOR FOR SCANNING FORCE MICROSCOPY
    ITOH, T
    SUGA, T
    SENSORS AND ACTUATORS A-PHYSICAL, 1994, 43 (1-3) : 305 - 310
  • [34] Atomic-scale roughness effect on capillary force in atomic force microscopy
    Jang, JY
    Ratner, MA
    Schatz, GC
    JOURNAL OF PHYSICAL CHEMISTRY B, 2006, 110 (02): : 659 - 662
  • [35] QUANTIFICATION OF FRICTION FORCE FOR DUAL-AXIS PROBE FRICTION FORCE MICROSCOPE
    Amakawa, Hiroaki
    Fukuzawa, Kenji
    Shikida, Mitsuhiro
    Zhang, Hedong
    Itoh, Shitaro
    PROCEEDINGS OF THE ASME/STLE INTERNATIONAL JOINT TRIBOLOGY CONFERENCE - 2009, 2010, : 39 - 41
  • [36] Effect of scanning force microscope scanner geometry on probe-sample contact force
    Chen, X
    Davies, MC
    Roberts, CJ
    Tendler, SJB
    Williams, PM
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (04): : 1773 - 1775
  • [37] Energy dissipation in scanning force microscopy-friction on an atomic scale
    Colchero, J.
    Baro, A. M.
    Marti, O.
    TRIBOLOGY LETTERS, 1996, 2 (04) : 327 - 343
  • [38] Mechanical and friction properties of thermoplastic polyurethanes determined by scanning force microscopy
    Mailhot, B
    Komvopoulos, K
    Ward, B
    Tian, Y
    Somorjai, GA
    JOURNAL OF APPLIED PHYSICS, 2001, 89 (10) : 5712 - 5719
  • [39] Control of friction force by light observed by friction force microscopy in a vacuum
    Sasaki, Michiko
    Xu, Yibin
    Goto, Masahiro
    APPLIED PHYSICS EXPRESS, 2017, 10 (01)
  • [40] Microscale friction investigation of polysilicon surface using scanning force microscopy
    Flueraru, C
    Cobianu, C
    Dascalu, D
    Flueraru, M
    EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 1998, 3 (01): : 29 - 33
12345