Effect of roughness slope on exchange biasing in NiO spin valves

被引：0
|
作者：
机构：
来源：
Appl Phys Lett | / 17卷 / 2162期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] Thermally assisted reversal of exchange biasing in NiO and FeMn based systems
    Appl Phys Lett, 4 (492):
  • [32] Exchange biasing in NiO/NiFe2O4 bilayers
    Negulescu, B
    Thomas, L
    Dumont, Y
    Tessier, M
    Keller, N
    Guyot, M
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2002, 242 (242-245) : 529 - 531
  • [33] Thermally assisted reversal of exchange biasing in NiO and FeMn based systems
    van der Heijden, PAA
    Maas, TFMM
    de Jonge, WJM
    Kools, JCS
    Roozeboom, F
    van der Zaag, PJ
    APPLIED PHYSICS LETTERS, 1998, 72 (04) : 492 - 494
  • [34] The effect of interface roughness on the perpendicular exchange bias of NiO/CoPt/Pt stacking structure
    GAO Ying
    HARUMOTO Takashi
    NAKAMURA Yoshio
    SHI Ji
    Science China Technological Sciences, 2021, 64 (03) : 605 - 610
  • [35] The effect of interface roughness on the perpendicular exchange bias of NiO/CoPt/Pt stacking structure
    Ying, Gao
    Takashi, Harumoto
    Yoshio, Nakamura
    Ji, Shi
    SCIENCE CHINA-TECHNOLOGICAL SCIENCES, 2021, 64 (03) : 605 - 610
  • [36] The effect of interface roughness on the perpendicular exchange bias of NiO/CoPt/Pt stacking structure
    Ying Gao
    Takashi Harumoto
    Yoshio Nakamura
    Ji Shi
    Science China Technological Sciences, 2021, 64 : 605 - 610
  • [37] The effect of interface roughness on the perpendicular exchange bias of NiO/CoPt/Pt stacking structure
    GAO Ying
    HARUMOTO Takashi
    NAKAMURA Yoshio
    SHI Ji
    Science China(Technological Sciences), 2021, (03) : 605 - 610
  • [38] Influence of deposition angle on the properties of NiO spin-valves
    Cartier, M.
    Auffret, S.
    Bayle-Guillemaud, P.
    Ernult, F.
    Fettar, F.
    Dieny, B.
    1600, American Institute of Physics Inc. (91):
  • [39] Temperature dependence of magnetoresistance in spin valves with different thicknesses of NiO
    Lai, Chih-Huang
    Regan, Thomas J.
    White, Robert L.
    Anthony, Thomas C.
    Journal of Applied Physics, 1997, 81 (8 pt 2A):
  • [40] Thermal relaxation of the pinned layer magnetization in NiO spin valves
    Taylor, RH
    O'Barr, R
    Yamamoto, SY
    Dieny, B
    JOURNAL OF APPLIED PHYSICS, 1999, 85 (08) : 5036 - 5038
12345