Atomic force microscope combined with scanning tunneling microscope [AFM/STM]

被引：0
|
作者：
Morita, Seizo [1 ]
Sugawara, Yasuhiro [1 ]
Fukano, Yoshinobu [1 ]
机构：
[1] Hiroshima Univ, Higashi-Hiroshima, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1993年 / 32卷 / 6 B期
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摘要：
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页码：2983 / 2988
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