Making, breaking and sliding of nanometer-scale contacts

被引：0
|
作者：
Carpick, R.W. [1 ,2 ]
Enachescu, M. [1 ]
Ogletree, D.F. [1 ]
Salmeron, M. [1 ]
机构：
[1] Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, United States
[2] Sandia National Laboratories, MS1413, Albuquerque, NM 87185-1413, United States
来源：
Materials Research Society Symposium - Proceedings | 1999年 / 539卷
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：93 / 103
相关论文
共 50 条
  • [21] Mechanics of fracture in nanometer-scale components
    Sumigawa, Takashi
    Fang, Hui
    Kawai, Emi
    Kitamura, Takayuki
    MECHANICAL ENGINEERING REVIEWS, 2014, 1 (01):
  • [22] Nanometer-Scale Objects of Deposition and Sputtering
    Pugina, E. V.
    Kornich, G. V.
    JOURNAL OF SURFACE INVESTIGATION, 2008, 2 (01): : 68 - 79
  • [23] Nanometer-scale objects of deposition and sputtering
    Zaporozhye National Technical University, Zaporozhye 69000, Ukraine
    J. Surf. Invest., 2008, 1 (68-79): : 68 - 79
  • [24] Nanometer-scale magnetic resonance imaging
    Chao, SH
    Dougherty, WM
    Garbini, JL
    Sidles, JA
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (05): : 1175 - 1181
  • [25] Adsorbate dynamics in a nanometer-scale box
    Luo, Miaomiao
    Cheng, Zhihai
    Wyrick, Jonathan
    Kim, Daeho
    Lu, Wenhao
    Kim, Kwangmoo
    Einstein, Ted
    Bartels, Ludwig
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2011, 241
  • [26] Nanometer-scale analysis of single molecule
    Kashimura, Yoshiaki
    Goto, Touichiro
    NTT Technical Review, 2009, 7 (08):
  • [27] Theory for electron hopping through nanometer-scale contacts: From tunneling regime to ballistic regime
    Hirose, K
    Kobayashi, N
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2005, 29 (3-4): : 515 - 519
  • [28] Characterization of Nanometer-Scale Gap Formation
    Lee, Donovan
    Tran, Helen
    Liu, Tsu-Jae King
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2010, 157 (01) : H94 - H98
  • [29] Noise in nanometer-scale electronic devices
    Nishiguchi, Katsuhiko
    Fujiwara, Akira
    NTT Technical Review, 2015, 13 (08):
  • [30] THE CHEMISTRY OF SIZE AND ORDER ON THE NANOMETER-SCALE
    HEATH, JR
    SCIENCE, 1995, 270 (5240) : 1315 - 1316
12345