Cross-sectional transmission electron microscopy observations and selected-area electron diffractions of interfaces of epitaxially grown diamond thin films on cubic boron nitride substrates

被引：0

作者：

Tomikawa, Tadashi ^{[1
]}

Shikata, Shin-ichi ^{[1
]}

机构：

[1] Sumitomo Electric Industries, Ltd, Hyogo, Japan

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1993年 / 32卷 / 9 A期

关键词：

Diamond thin films - Heteroepitaxy - Lattice constants - Microwave plasma enhanced chemical vapor deposition - Selected area transmission electron diffraction (SATED) technique - Sintered polycrystalline cubic boron nitride substrates;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：3938 / 3942

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