Scanning force and friction microscopy at highly oriented polycrystalline graphite and CuP2(100) surfaces in ultrahigh vacuum

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Muller, T.

Kasser, T.

Labardi, M.

Lux-Steiner, M.

Marti, O.

Mlynek, J.

Krausch, G.

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Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena | 1996年 / 14卷 / 02期

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