Scanning force and friction microscopy at highly oriented polycrystalline graphite and CuP2(100) surfaces in ultrahigh vacuum

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作者：
Muller, T.
Kasser, T.
Labardi, M.
Lux-Steiner, M.
Marti, O.
Mlynek, J.
Krausch, G.
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Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena | 1996年 / 14卷 / 02期
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