共 50 条
- [46] Role of ion energy and flux on inductively coupled plasma etch damage in InGaN/GaN multi quantum well light emitting diodes JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (10): : 7234 - 7237
- [47] ANALYSIS OF SURFACE CONTAMINANTS ON GALLIUM-ARSENIDE AND SILICON BY HIGH-RESOLUTION TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (03): : 512 - 516
- [48] High-energy ion generation in interaction of short laser pulse with high-density plasma APPLIED PHYSICS B-LASERS AND OPTICS, 2002, 74 (03): : 207 - 215