Imaging field-dependent structure in charge-density waves by X-ray diffraction topography

被引：0

作者：

Li, Y. ^{[1
]}

Lemay, S.G. ^{[2
]}

Price, J.H. ^{[1
]}

Cicak, K. ^{[2
]}

O'Neill, K. ^{[2
]}

Ringland, K. ^{[2
]}

Finkelstein, K.D. ^{[3
]}

Brock, J.D. ^{[1
]}

Thorne, R.E. ^{[2
]}

机构：

[1] Sch. of Appl. and Eng. Physics, Cornell University, Ithaca, NY 14853, United States

[2] Lab. of Atom. and Solid Stt. Physics, Cornell University, Ithaca, NY 14853, United States

[3] Cornell High-Ener. Synchrt. Source, Ithaca, NY 14853, United States

来源：

Journal De Physique. IV : JP | 1999年 / 9卷 / 10期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：10 / 151

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