Imaging field-dependent structure in charge-density waves by X-ray diffraction topography

被引：0
|
作者：
Li, Y. [1 ]
Lemay, S.G. [2 ]
Price, J.H. [1 ]
Cicak, K. [2 ]
O'Neill, K. [2 ]
Ringland, K. [2 ]
Finkelstein, K.D. [3 ]
Brock, J.D. [1 ]
Thorne, R.E. [2 ]
机构：
[1] Sch. of Appl. and Eng. Physics, Cornell University, Ithaca, NY 14853, United States
[2] Lab. of Atom. and Solid Stt. Physics, Cornell University, Ithaca, NY 14853, United States
[3] Cornell High-Ener. Synchrt. Source, Ithaca, NY 14853, United States
来源：
Journal De Physique. IV : JP | 1999年 / 9卷 / 10期
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页码：10 / 151
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