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- [1] COMPUTER AIDED LOSS INVESTIGATION AND MONITORING. Quarterly Journal of Technical Papers (Institute of Petroleum), 1988, : 41 - 43
- [3] Bank measurement leads to improved quality of extruded sheets or films ANTEC 2000: SOCIETY OF PLASTICS ENGINEERS TECHNICAL PAPERS, CONFERENCE PROCEEDINGS, VOLS I-III, 2000, : 393 - 397
- [4] AUTOMATIC-MEASUREMENT OF THICKNESS AND UNIFORMITY OF THIN-FILMS BY A COMPUTER-AIDED DEVICE NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1993, 334 (01): : 211 - 216
- [6] Chromatic monitoring technique for thickness measurement of thin transparent films ATOMIC AND MOLECULAR PHYSICS, 2003, 5258 : 206 - 209
- [7] A Computer-Aided Method for Automatic Localization and Thickness Measurement of Peritoneum in Ultrasound Images 2011 ANNUAL INTERNATIONAL CONFERENCE OF THE IEEE ENGINEERING IN MEDICINE AND BIOLOGY SOCIETY (EMBC), 2011, : 8005 - 8008
- [9] Determination of alternative monitoring wavelength to increase the accuracy of measuring the layers thickness during the thin films manufacture MODELING ASPECTS IN OPTICAL METROLOGY VII, 2019, 11057
- [10] New Results in Computer-Aided Thickness Measurement of Galvanic Coatings by Eddy Current Probes. Messen und Pruefen, 1979, 15 (03): : 134 - 138