Stochastic wire-length distribution for gigascale integration (GSI) - Part II: Applications to clock frequency, power dissipation, and chip size estimation

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Georgia Inst of Technology, Atlanta, United States ^{[1
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IEEE Trans Electron Devices | / 3卷 / 590-597期

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[1] A stochastic wire-length distribution for gigascale integration (GSI) - Part II: Applications to clock frequency, power dissipation, and chip size estimation
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[2] A stochastic wire-length distribution for gigascale integration (GSI) - Part I: Derivation and validation
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