Automatic analog test signal generation using multifrequency analysis

被引：0
|
作者：
Huynh, Sam D. [1 ]
Kim, Seongwon [1 ]
Soma, Mani [1 ]
Zhang, Jinyan [1 ]
机构：
[1] University of Washington, Department of Electrical Engineering, Seattle, WA 98195-2500, United States
来源：
IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing | 1999年 / 46卷 / 05期
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页码：565 / 576
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