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- [28] THE ROOM-TEMPERATURE OXIDATION OF CU/SI(100) AND CU/SI(111) INTERFACES STUDIED BY AUGER-ELECTRON SPECTROSCOPY, ELECTRON ENERGY-LOSS SPECTROSCOPY, AND HIGH-RESOLUTION ELECTRON ENERGY-LOSS SPECTROSCOPY JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04): : 996 - 1002