PROBLEMS OF TESTING LARGE-SCALE INTEGRATED CIRCUITS.

被引:0
|
作者
Waters, D.G.P.
机构
来源
British Telecommunications Engineering | 1982年 / 1卷 / pt 2期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
INTEGRATED CIRCUIT TESTING
引用
收藏
页码:64 / 69
相关论文
共 50 条
  • [1] THE PROBLEMS OF TESTING LARGE-SCALE INTEGRATED-CIRCUITS
    WATERS, DGP
    [J]. BRITISH TELECOMMUNICATIONS ENGINEERING, 1982, 1 (JUL): : 64 - 69
  • [2] PATTERN DEFINITION FOR THE MANUFACTURE OF LARGE-SCALE INTEGRATED CIRCUITS.
    Heslop, C.J.
    Hines, R.E.
    Woodward, J.W.
    [J]. Post Office Electrical Engineers Journal, 1981, 73 (pt 4): : 208 - 215
  • [3] ELECTRON BEAM TESTING OF ULTRA LARGE SCALE INTEGRATED CIRCUITS.
    Garth, Simon C.J.
    [J]. Microelectronic Engineering, 1986, 4 (02) : 121 - 138
  • [4] DYNAMIC INSPECTION OF LARGE SCALE INTEGRATED CIRCUITS.
    Child, M.R.
    Ranasinghe, D.W.
    White, D.
    [J]. Microelectronics Journal, 1976, 7 (03) : 43 - 48
  • [5] RELIABILITY ASSURANCE FOR LARGE SCALE INTEGRATED CIRCUITS.
    McDonald, Robert A.
    [J]. AGARD Conference Proceedings, 1979, (261 Avionics Reliab): : 1 - 25
  • [6] Wiring Algorithms for Very Large Scale Integrated Circuits.
    Rothermel, Hans-Juergen
    [J]. Fortschritt-Berichte der VDI-Zeitschriften, Reihe 10: Angewandte Informatik, 1984, (32):
  • [7] SMALL-SCALE PHYSICS FOR LARGE-SCALE ELECTRONIC CIRCUITS.
    Frey, Jeffrey
    [J]. Engineering: Cornell Quarterly, 1983, 18 (03): : 12 - 15
  • [8] PROBABILISTIC APPROACH FOR TESTING LARGE-SCALE INTEGRATED-CIRCUITS
    SINGH, S
    SINGH, VP
    [J]. INTERNATIONAL JOURNAL OF COMPUTER & INFORMATION SCIENCES, 1978, 7 (03): : 283 - 294
  • [9] Large-scale photonic integrated circuits
    Nagarajan, R
    Joyner, CH
    Schneider, RP
    Bostak, JS
    Butrie, T
    Dentai, AG
    Dominic, VG
    Evans, PW
    Kato, M
    Kauffman, M
    Lambert, DJH
    Mathis, SK
    Mathur, A
    Miles, RH
    Mitchell, ML
    Missey, MJ
    Murthy, S
    Nilsson, AC
    Peters, FH
    Pennypacker, SC
    Pleumeekers, JL
    Salvatore, RA
    Schlenker, RK
    Taylor, RB
    Tsai, HS
    Van Leeuwen, MF
    Webjorn, J
    Ziari, M
    Perkins, D
    Singh, J
    Grubb, SG
    Reffle, MS
    Mehuys, DG
    Kish, FA
    Welch, DF
    [J]. IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2005, 11 (01) : 50 - 65
  • [10] SIMULATION OF VERY LARGE SCALE INTEGRATED CIRCUITS. AN OVERVIEW.
    Garbs, R.T.
    [J]. Modeling and Simulation, Proceedings of the Annual Pittsburgh Conference, 1979,