THE PROBLEMS OF TESTING LARGE-SCALE INTEGRATED-CIRCUITS

被引：0

作者：

WATERS, DGP

机构：

来源：

BRITISH TELECOMMUNICATIONS ENGINEERING | 1982年 / 1卷 / JUL期

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中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：64 / 69

页数：6

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[1] PROBABILISTIC APPROACH FOR TESTING LARGE-SCALE INTEGRATED-CIRCUITS
SINGH, S
SINGH, VP
[J]. INTERNATIONAL JOURNAL OF COMPUTER & INFORMATION SCIENCES, 1978, 7 (03): : 283 - 294
[2] PROBLEMS OF TESTING LARGE-SCALE INTEGRATED CIRCUITS.
Waters, D.G.P.
[J]. British Telecommunications Engineering, 1982, 1 (pt 2): : 64 - 69
[3] TECHNIQUES FOR THE SIMULATION OF LARGE-SCALE INTEGRATED-CIRCUITS
NEWTON, AR
[J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1979, 26 (09): : 741 - 749
[4] S-ELEMENT INTEGRATED-CIRCUITS .2. LARGE-SCALE INTEGRATED-CIRCUITS
ZOLOTAREV, JG
KOMAROVSKIKH, KF
STAFEEV, VI
[J]. AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA, 1978, (01): : 88 - 88
[5] MOLYBDENUM METALLIZATION SYSTEM FOR LARGE-SCALE INTEGRATED-CIRCUITS
OIKAWA, H
WADA, T
AMAZAWA, T
[J]. REVIEW OF THE ELECTRICAL COMMUNICATIONS LABORATORIES, 1976, 24 (5-6): : 407 - 417
[6] PATTERN DEFINITION FOR THE MANUFACTURE OF LARGE-SCALE INTEGRATED-CIRCUITS
HESLOP, CJ
HINES, RE
WOODWARD, JW
[J]. POST OFFICE ELECTRICAL ENGINEERS JOURNAL, 1981, 73 (JAN): : 208 - 215
[7] EVALUATING METHODS OF DESIGNING LARGE-SCALE INTEGRATED-CIRCUITS
ALEKSENKO, AG
SAMOTAEV, NA
[J]. SOVIET MICROELECTRONICS, 1987, 16 (02): : 73 - 75
[8] DEVELOPMENT OF INTERCONNECTION TECHNOLOGY FOR LARGE-SCALE INTEGRATED-CIRCUITS
BABUKA, R
SAXENMEYER, GJ
SCHULTZ, LK
[J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1982, 26 (03) : 318 - 327
[9] GALLIUM-ARSENIDE LARGE-SCALE INTEGRATED-CIRCUITS
LONG, SI
WELCH, BM
ZUCCA, R
EDEN, RC
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03): : 531 - 536
[10] ELECTRON DETECTORS FOR ELECTRON-BEAM TESTING OF ULTRA LARGE-SCALE INTEGRATED-CIRCUITS
GARTH, SCJ
SPICER, DF
[J]. SCANNING ELECTRON MICROSCOPY, 1986, 1986 : 465 - 472

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