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- [4] Energy spectra of electrons backscattered from sample surfaces with heterostructures using field-emission scanning tunneling microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2006, 45 (3 B): : 2278 - 2282
- [10] Experimental measurement of the intensity profiles of a low-energy electron beam extracted from a scanning tunneling microscope tip by field emission Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1999, 38 (10): : 6172 - 6173