Analytic methods in the determination of optical properties by spectral ellipsometry

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作者：
Fluckiger, David U. [1 ]
机构：
[1] Verity Instruments, Inc., 2901 Eisenhower Street, Carrollton, TX 75007, United States
来源：
Journal of the Optical Society of America A: Optics and Image Science, and Vision | 1998年 / 15卷 / 08期
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页码：2228 / 2232
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