Effect of field strength on susceptibility artifacts in magnetic resonance imaging

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机构：
[1] Farahani, K.
[2] Sinha, U.
[3] Sinha, S.
[4] Chiu, L.C.-L.
[5] Lufkin, R.B.
来源：
Lufkin, R.B. | 1600年 / 14期
关键词：
Field Strength Effect - Paranasal Sinuses - Susceptibility Artifacts;
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