TEST OF TWO DEPTH PROFILING TECHNIQUES USING PIXE.

被引：0
|
作者：
Frontier, Jean-Pierre [1 ]
Regnier, Pierre [1 ]
Brilliard, Lucette [1 ]
Brissaud, Ivan [1 ]
机构：
[1] CEN Saclay, Gif-sur-Yvette, Fr, CEN Saclay, Gif-sur-Yvette, Fr
来源：
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms | 1986年 / B14卷 / 03期
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摘要：
10
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页码：348 / 352
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