Control circuit for a scanning tunneling microscope

被引:0
|
作者
Universidad de Chile, Santiago, Chile [1 ]
机构
来源
Rev Sci Instrum | / 9卷 / 3259-3267期
关键词
Amplifiers (electronic) - Analog to digital conversion - Calibration - Diffraction gratings - Digital to analog conversion - Electric network synthesis - Low pass filters - Piezoelectric transducers - Spurious signal noise;
D O I
暂无
中图分类号
学科分类号
摘要
A control circuit was designed to control a piezoelectric tube scanner having the standard single inner-electrode quartered outer-electrode configuration. The control circuit allows both analog and digital feedback. The circuit was tested using two 12 bit A/D-D/A converters DAS 1602 to control the scanner of the scanning tunneling microscope. With the complete system in operation but in the absence of tunneling current, the electrometer exhibits a current noise under 3 pA rms and a response time of 30 μs to a step input current. Images of a commercial holographic grating covered with gold running the instrument in the digital feedback were obtained to calibrate the instrument and verify proper control operation. The control circuit and the electrometer turned out to be about an order of magnitude less expensive than commercially available control circuits and low noise current amplifiers of similar performance.
引用
收藏
相关论文
共 50 条
  • [21] The scanning tunneling microscope in electrochemistry
    Schneeweiss, MA
    Kolb, DM
    CHEMIE IN UNSERER ZEIT, 2000, 34 (02) : 72 - 84
  • [22] NANOFABRICATION WITH THE SCANNING TUNNELING MICROSCOPE
    DELOZANNE, A
    EHRICHS, EE
    SMITH, WF
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1991, 202 : 362 - PHYS
  • [23] SCANNING TUNNELING MICROSCOPE AUTOMATION
    AGUILAR, M
    PASCUAL, PJ
    SANTISTEBAN, A
    IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) : 525 - 532
  • [24] MICROFABRICATED SCANNING TUNNELING MICROSCOPE
    AKAMINE, S
    ALBRECHT, TR
    ZDEBLICK, MJ
    QUATE, CF
    IEEE ELECTRON DEVICE LETTERS, 1989, 10 (11) : 490 - 492
  • [25] Evaporation of silicon nanoparticles under scanning tunneling microscope control
    Hager, Michaela
    Berezin, Alexander S.
    Zinkicheva, Tamara T.
    Bohme, Diethard K.
    Probst, Michael
    Scheier, Paul
    Nazmutdinov, Renat R.
    CHEMICAL PHYSICS, 2013, 425 : 141 - 147
  • [26] Variable structure control of a piezoelectric actuator for a scanning tunneling microscope
    Bonnail, N
    Tonneau, D
    Jandard, F
    Capolino, GA
    Dallaporta, H
    IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2004, 51 (02) : 354 - 363
  • [27] THEORY OF THE SCANNING TUNNELING MICROSCOPE
    TERSOFF, J
    HAMANN, DR
    PHYSICAL REVIEW B, 1985, 31 (02): : 805 - 813
  • [28] A scanning tunneling microscope control system based on fast microcontrollers
    Bredekamp, AH
    Tapson, J
    PROCEEDINGS OF THE 1998 SOUTH AFRICAN SYMPOSIUM ON COMMUNICATIONS AND SIGNAL PROCESSING: COMSIG '98, 1998, : 225 - 228
  • [29] Research on precision stage and control technology of scanning tunneling microscope
    Wei, Qiang
    Zhang, Yulin
    Song, Huiying
    Hao, Huijuan
    Zhongguo Jixie Gongcheng/China Mechanical Engineering, 2007, 18 (02): : 193 - 196
  • [30] THEORY OF THE SCANNING TUNNELING MICROSCOPE
    PENDRY, JB
    PRETRE, AB
    KRUTZEN, BCH
    JOURNAL OF PHYSICS-CONDENSED MATTER, 1991, 3 (24) : 4313 - 4321