Measuring level with radar technology

被引：0
|
作者：
机构：
[1] Fitch, Fredrick M.
来源：
Fitch, Fredrick M. | 1600年 / 10期
关键词：
Level gages - Microwave radar - Radar level measurement - Ullage measurement;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [11] Radar: Is it a new technology applicable to water level gauging?
    Kranz, S
    Zenz, T
    Barjenbruch, U
    PHYSICS AND CHEMISTRY OF THE EARTH PART C-SOLAR-TERRESTIAL AND PLANETARY SCIENCE, 2001, 26 (10-12): : 751 - 754
  • [12] Radar technology levels up the market - Today's level-measuring equipment is capable of delivering measurements "exact to the millimeter"
    Noble, T
    CHEMICAL ENGINEERING PROGRESS, 2001, 97 (06) : 15 - 16
  • [13] Research on high accuracy angle measuring technology of MMW monopulse radar
    Li, BG
    Zhao, HZ
    Fu, Q
    2005 IEEE International Radar, Conference Record, 2005, : 753 - 756
  • [14] The Design of FMCW Radar Liquid Level Measuring System Based on FPGA
    Zhao Zeng-rong
    Qiu Yao-hui
    PROCEEDINGS OF 2014 IEEE WORKSHOP ON ADVANCED RESEARCH AND TECHNOLOGY IN INDUSTRY APPLICATIONS (WARTIA), 2014, : 536 - 538
  • [15] Measuring university technology transfer efficiency: a maturity level approach
    Secundo, Giustina
    De Beer, Christle
    Passiante, Giuseppina
    MEASURING BUSINESS EXCELLENCE, 2016, 20 (03) : 42 - 54
  • [16] Measuring Technology Readiness Index Level: Scale Adaption Study
    Gunaltay, Meliha Melis
    Onder, oemer Rifki
    Ozgur, Emrah Gokay
    JOURNAL OF MEHMET AKIF ERSOY UNIVERSITY ECONOMICS AND ADMINISTRATIVE SCIENCES FACULTY, 2024, 11 (01): : 51 - 65
  • [17] Novel radar level gauge using 24-GHz-technology
    Oréans, L
    Heide, P
    TECHNISCHES MESSEN, 2000, 67 (05): : 214 - 219
  • [18] Siemens radar technology for bin level monitoring at Teutonia Zementwerk AG
    不详
    ZKG INTERNATIONAL, 2003, 56 (07): : 39 - 41
  • [19] ON MEASURING YIELD POTENTIAL OF THE HIGH YIELDING VARIETIES TECHNOLOGY AT FARM LEVEL
    KALIRAJAN, K
    JOURNAL OF AGRICULTURAL ECONOMICS, 1982, 33 (02) : 227 - 235
  • [20] A New Perspective of Multiple-level for Measuring & Mapping Technology Relatedness
    Luan, Chunjuan
    Song, Bowen
    Porter, Alan L.
    17TH INTERNATIONAL CONFERENCE ON SCIENTOMETRICS & INFORMETRICS (ISSI2019), VOL I, 2019, : 140 - 150
12345