Hidden Markov model-based algorithm for fault diagnosis with partial and imperfect tests

被引：0
|
作者：
Ying, Jie [1 ]
Kirubarajan, T. [1 ]
Pattipati, Krishna R. [1 ]
Patterson-Hine, Ann [1 ]
机构：
[1] Department of Electrical and Systems Engineering, University of Connecticut, Storrs, CT 06269-3157, United States
来源：
| 2000年 / Institute of Electrical and Electronics Engineers Inc., Piscataway, NJ, USA卷 / 30期
关键词：
Hidden markov model (HMM) - Baum-Welch algorithms - Fault diagnosis - Hamming distance - Viterbi decoding;
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