Orientation of thin YBa2Cu3O7-δ/YSZ films characterization by micro-Raman spectroscopy

被引：0
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作者：
Chen, M.S. [1 ]
Shen, Z.X. [1 ]
Zhou, W.Z. [1 ]
Xu, S.Y. [1 ]
Ong, C.K. [1 ]
机构：
[1] Department of Physics, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260, Singapore
来源：
Superconductor Science and Technology | 1999年 / 12卷 / 05期
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页码：315 / 318
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