共 15 条
- [1] FREQUENCY-DEPENDENT PHOTOVOLTAGE-GENERATING AREAS IN A STRONGLY-INVERTED OXIDIZED PARA-TYPE SILICON-WAFER JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1987, 26 (10): : 1663 - 1666
- [3] SATURATION OF AC SURFACE PHOTOVOLTAGES DUE TO PHOTOCAPACITANCES IN A STRONGLY-INVERTED OXIDIZED P-TYPE SILICON-WAFER JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1987, 26 (04): : 564 - 567
- [4] Ac SURFACE PHOTOVOLTAGES IN STRONGLY-INVERTED OXIDIZED p-TYPE SILICON WAFERS. Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes, 1984, 23 (11): : 1451 - 1461
- [5] AC SURFACE PHOTOVOLTAGES IN STRONGLY-INVERTED OXIDIZED P-TYPE SILICON-WAFERS JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1984, 23 (11): : 1451 - 1461
- [6] ANALYSIS OF AC SURFACE PHOTOVOLTAGES IN A DEPLETED OXIDIZED p-TYPE SILICON WAFER. Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes, 1986, 25 (06): : 807 - 812
- [8] Analytical estimation of effective lifetimes of minority carriers injected with laser pulse into dry-oxidized p-type silicon wafer JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2004, 43 (11A): : L1394 - L1396
- [9] Behavior of metal-induced negative oxide charges on the surface of N-type silicon wafers using frequency-dependent AC surface photovoltage measurements JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (6A): : 3778 - 3783
- [10] Quantitative estimation of the metal-induced negative oxide charge density in n-type silicon wafers from measurements of frequency-dependent AC surface photovoltage JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2006, 45 (3A): : 1471 - 1476