Femtosecond laser ablation of sapphire: Time-of-flight analysis of ablation plume

被引：0

作者：

Varel, H. ^{[1
]}

Waehmer, M. ^{[1
]}

Rosenfeld, A. ^{[1
]}

Ashkenasi, D. ^{[1
]}

Campbell, E.E.B. ^{[1
]}

机构：

[1] Max-Born-Inst fuer Nichtlineare, Optik und Kurzzeitspektroskopie, Berlin, Germany

来源：

Applied Surface Science | 1998年 / 127-129卷

关键词：

Ion exchange - Mass spectrometry - Pulsed laser applications - Sapphire - Ultrafast phenomena;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Time-of-flight mass spectrometry has been used to investigate the mass and velocity distributions of positive ions produced on laser ablation of sapphire with ultrashort (200 fs) laser pulses at a wavelength of 790 nm. Aluminum and oxygen ions were observed with the proportion of singly and doubly charged oxygen ions increasing with increasing number of laser shots for a given laser fluence. The ions have extremely high kinetic energies which is attributed to Coulomb explosion from charged defect sites.

引用

页码：128 / 133

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