ADDRESS RECONFIGURATION FOR LARGE-SCALE INTEGRATED MEMORY YIELD ENHANCEMENT.

被引：0
|
作者：
Bossen, D.C.
Hsiao, M.Y.
Mikhail, W.F.
机构：
来源：
IBM Technical Disclosure Bulletin | 1973年 / 16卷 / 04期
关键词：
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
This scheme permits the use of single bad bit memory chips with the loss of only one bit position of the chip.
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