Simple Calculable Linearity Measurement on Secondary Electron Multipliers.

被引：0
|
作者：
Klenert, Max
机构：
来源：
Optik (Jena) | 1980年 / 57卷 / 01期
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
ELECTRON TUBES, PHOTOMULTIPLIER
引用
收藏
页码：143 / 149
相关论文
共 50 条
  • [41] A SIMPLE TECHNIQUE FOR ELECTRON LINAC BEAM PROFILE MEASUREMENT
    RODDA, JL
    NUCLEAR INSTRUMENTS & METHODS, 1970, 80 (02): : 333 - &
  • [42] A SIMPLE METHOD FOR THE MEASUREMENT OF ELECTRON-BEAM ENERGY
    KNIZHNIK, EI
    MOSKALEV, VA
    ONISKO, AD
    SOVIET ATOMIC ENERGY, 1986, 60 (03): : 279 - 281
  • [43] Measurement of Secondary Electron Energy Spectra of Polymethyl Methacrylate
    翁明
    刘婉
    殷明
    王芳
    曹猛
    Chinese Physics Letters, 2018, 35 (04) : 116 - 120
  • [44] Consideration of secondary electron emission effect for probe measurement
    Faculty of Engineering, Yokohama National University, Yokohama 240-8501, Japan
    不详
    不详
    Jpn. J. Appl. Phys., 9
  • [45] MEASUREMENT OF SECONDARY ELECTRON EMISSION FROM DIELECTRIC SURFACES
    HEYDT, HL
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1950, 21 (07): : 639 - 643
  • [46] Secondary electron measurement and XPS characterization of NEG coatings
    Sharma, R. K.
    Sinha, Atul K.
    Gupta, Nidhi
    Nuwad, J.
    Jagannath
    Gadkari, S. C.
    Singh, M. R.
    Gupta, S. K.
    SOLID STATE PHYSICS: PROCEEDINGS OF THE 58TH DAE SOLID STATE PHYSICS SYMPOSIUM 2013, PTS A & B, 2014, 1591 : 916 - 918
  • [47] Consideration of Secondary Electron Emission Effect for Probe Measurement
    Tawaraya, Takehito
    Tsushima, Akira
    Yoshimura, Shinji
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2012, 51 (09)
  • [48] On the measurement of low energy backscattered and secondary electron coefficients
    El Gomati, MM
    Assa'd, AMD
    El Gomati, T
    Zadrazil, M
    ELECTRON MICROSCOPY AND ANALYSIS 1997, 1997, (153): : 265 - 268
  • [49] Measurement of Secondary Electron Energy Spectra of Polymethyl Methacrylate
    Weng, Ming
    Liu, Wan
    Yin, Ming
    Wang, Fang
    Cao, Meng
    CHINESE PHYSICS LETTERS, 2018, 35 (04)
  • [50] MEASUREMENT OF THE COEFFICIENT OF SECONDARY ELECTRON EMISSION WITH A RESONANT CAVITY
    SMITHER, RK
    PHYSICAL REVIEW, 1955, 99 (02): : 646 - 646
12345