USE OF PRONY'S METHOD FOR MEASURING THE THICKNESS OF LAYERED DIELECTRICS.

被引：0
|
作者：
Drobakhin, O.O. [1 ]
Korotkaya, V.G. [1 ]
机构：
[1] Dneptropetrovsk State Univ, Dneptropetrovsk, USSR, Dneptropetrovsk State Univ, Dneptropetrovsk, USSR
来源：
The Soviet journal of nondestructive testing | 1987年 / 23卷 / 05期
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摘要：
23
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页码：315 / 323
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