Ellipsometric measurements with multilayers

被引：0

作者：

Franz, G. ^{[1
]}

Erichsen, P. ^{[1
,2
]}

Kross, J. ^{[1
]}

机构：

[1] Optisches Institut, Technische Universität Berlin, Straße des 17. Juni 135, D-10623 Berlin, Germany

[2] Fritz-Haber-Institut, Faradayweg 4-6, D-14195 Berlin, Germany

来源：

Optik (Jena) | 1999年 / 110卷 / 09期

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摘要：

引用

页码：426 / 432

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