Ellipsometric measurements with multilayers

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作者：
Franz, G. [1 ]
Erichsen, P. [1 ,2 ]
Kross, J. [1 ]
机构：
[1] Optisches Institut, Technische Universität Berlin, Straße des 17. Juni 135, D-10623 Berlin, Germany
[2] Fritz-Haber-Institut, Faradayweg 4-6, D-14195 Berlin, Germany
来源：
Optik (Jena) | 1999年 / 110卷 / 09期
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页码：426 / 432
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